Scanning Electronic Microscopy

At our Development and Testing (DAT) Department we specialise in developing, optimizing, and testing various joining solutions which often leads to introducing new ground-breaking solutions to challenging problems for the industry.

At our laboratory, we are able to conduct testing and analysis of assemblies and components from a joining perspective with our Optical Microscopy (OM), Scanning Electron Microscopy (SEM) and Energy-Dispersive X-ray Spectroscopy (EDX) capabilities.